Company Filing History:
Years Active: 2007
Title: The Innovative Contributions of Paul Abelovski
Introduction
Paul Abelovski, an accomplished inventor located in Escondido, California, holds a significant patent that reflects his expertise in the field of electronic circuits. His innovations are pivotal for advancing technologies that rely on digital signal processing.
Latest Patents
Abelovski's notable patent is titled "Digital BIST test scheme for ADC/DAC circuits." This invention presents a generalized method for testing Digital to Analog Converters (DACs) and Analog to Digital Converters (ADCs), including various types such as Sigma Delta, Successive Approximation, Pipeline, and Flash ADCs. The unique approach allows for paired testing of DACs and ADCs utilizing a Digital Tester and on-chip test circuitry, significantly optimizing the testing process by enabling operations at the maximum allowed clock frequency, thus reducing test time. The testing scheme includes essential components like cell logic, two multiplexer cells, and an internal Analog Test Bus. Notably, this design is scalable, accommodating multiple DACs and ADCs on the same integrated circuit, regardless of variations in bit addresses or the number of devices being tested.
Career Highlights
Currently, Paul Abelovski is associated with Toshiba America Electronic Components, Inc., where his contributions have significantly impacted the development and testing of electronic components. His sole patent exemplifies his innovative approach and problem-solving abilities in the field of electronics.
Collaborations
Throughout his career, Abelovski has had the privilege of collaborating with talented individuals like Luverne Ray Peterson and Jonathan A Levi. Their collective expertise in the industry has undoubtedly led to fruitful discussions and advancements in their projects.
Conclusion
Paul Abelovski stands out as a noteworthy inventor whose work has paved the way for improved testing methodologies in the realm of electronic circuits. His groundbreaking patent facilitates faster and more efficient assessments of critical electronic components, underscoring his invaluable role in the evolution of technology.