This inventor holds 1 USPTO granted patent. Top assignee: Kla Corporation. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Paul A. Konicek: Innovator in Particle Size Standards
Introduction
Paul A. Konicek is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of particle size standards, particularly in the calibration of high-energy inspection systems. His innovative approach has paved the way for advancements in various technological applications.
Latest Patents
Konicek holds a patent titled "Method of fabricating particle size standards on substrates." This patent describes a reference substrate designed for calibrating high-energy inspection systems. The substrate features permanently affixed particle-emulating and integral void-type environmentally inert surface features that emulate particles and defects with sizes below approximately 18 nm. The fabrication process involves techniques such as e-beam lithography and focused ion beam etching. The actual size of each surface feature is meticulously measured and recorded, allowing for precise calibration during inspection tool sessions.
Career Highlights
Paul A. Konicek is currently associated with Kla Corporation, where he continues to develop innovative solutions in the field of particle size standards. His work has been instrumental in enhancing the accuracy of inspection systems, which are crucial in various industries.
Collaborations
Konicek collaborates with professionals in his field, including his coworker Farhat A. Quli. Their combined expertise contributes to the advancement of technologies related to particle size measurement and calibration.
Conclusion
Paul A. Konicek's contributions to the field of particle size standards exemplify the impact of innovation in technology. His work continues to influence the calibration processes in high-energy inspection systems, showcasing the importance of precise measurements in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
