Mölnlycke, Sweden

Patrick Ehlers

This inventor holds 3 USPTO granted patents and 4 published patent applications. Top assignee: Endress+hauser Optical Analysis, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Patrick Ehlers. Retrieved from https://idiyas.com/inventor/patrick-ehlers

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 3.7

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
3 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Patrick Ehlers

Introduction

Patrick Ehlers is a notable inventor based in Mölnlycke, Sweden. He has made significant contributions to the field of optical analysis through his innovative patent. His work focuses on enhancing measurement techniques in specific applications, showcasing his expertise and dedication to advancing technology.

Latest Patents

Patrick Ehlers holds a patent for a "Spectrometric measurement method." This method involves determining measurement results of measurands in a medium specific to an application type. The process includes establishing a universal model based on training data, which aids in predicting each measurand. For each measurement situation, a dedicated model is created to determine accurate measurement results based on the measured spectra.

Career Highlights

Ehlers is currently employed at Endress+Hauser Optical Analysis, Inc., where he applies his knowledge and skills to develop advanced measurement solutions. His innovative approach has positioned him as a key player in the field of optical analysis.

Collaborations

Throughout his career, Patrick has collaborated with talented individuals such as Randy Benedict and Florian Krogmann. These partnerships have contributed to the development of cutting-edge technologies and methodologies in their field.

Conclusion

Patrick Ehlers exemplifies the spirit of innovation through his contributions to spectrometric measurement methods. His work not only enhances measurement accuracy but also reflects his commitment to advancing technology in optical analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…