The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Dec. 23, 2024
Applicant:

Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);

Inventors:

Joel Patrow, Ann Arbor, MI (US);

Marc Winter, Gelnhausen, DE;

Patrick Ehlers, Mölnlycke, SE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/075 (2024.01); G01N 15/00 (2024.01);
U.S. Cl.
CPC ...
G01N 15/075 (2024.01); G01N 2015/03 (2013.01);
Abstract

A spectrometric measurement method of determining concentrations of components present in a medium of a given type exhibiting different compositions in different applications includes, for at least one new application, determining a new model for determining concentrations of target components based on measured spectra of the medium of the given type present in the new application, wherein the new model is determined based on assets for determining concentrations of reference components corresponding to the target components that have been determined for reference applications, wherein the reference components have been of interest.


Find Patent Forward Citations

Patrow, Joel. (2026). Spectroscopic measurement method (U.S. Patent No. 12754121). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754121

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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