Company Filing History:
Years Active: 2016-2017
Title: Innovations of Pascal Alexander Oehler
Introduction
Pascal Alexander Oehler is a notable inventor based in Buchs, Switzerland. He has made significant contributions to the field of microscopy through his innovative patents. With a total of two patents to his name, Oehler's work focuses on enhancing the functionality and efficiency of atomic force microscopes and scanning probe microscopes.
Latest Patents
Oehler's latest patents include a "Sample holder for an atomic force microscope." This invention relates to sample holders designed to hold samples, particularly for atomic force microscopes. The sample holder comprises a sample dish with a bottom and an opening arranged in the bottom for receiving and holding the sample. Additionally, it includes a sample holder system and a method for transferring biological samples from a biopsy tool to the sample holder.
Another significant patent is the "Method and device for controlling a scanning probe microscope." This invention outlines a method for controlling a scanning probe microscope equipped with a probe that interacts with a sample. It involves monitoring the extension of a piezo element along a specific direction and adjusting the probe's level using an additional actuator when the nanoscanner exhibits an extension beyond a threshold value.
Career Highlights
Oehler has worked at prestigious institutions such as the University of Basel and Universitat Basel. His experience in these academic environments has contributed to his innovative research and development in microscopy technologies.
Collaborations
Throughout his career, Oehler has collaborated with notable individuals, including Marko Loparic and Roderick Lim. These collaborations have likely enriched his work and led to advancements in his field.
Conclusion
Pascal Alexander Oehler is a distinguished inventor whose contributions to microscopy have paved the way for advancements in scientific research. His innovative patents reflect his commitment to enhancing the capabilities of microscopy technologies.
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