The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Dec. 12, 2013
Universitat Basel, Basel, CH;
Roderick Lim, Riehen/Basel, CH;
Marija Plodinec, Basel, CH;
Marko Loparic, Basel, CH;
Pascal Oehler, Buchs, CH;
Leon Camenzind, Basel, CH;
UNIVERSITAT BASEL, Basel, CH;
Abstract
The present invention relates to a method for controlling a scanning probe microscope having a probe () with a tip () for interacting with a sample (), and a nanoscanner () for retaining the sample () or the probe (), comprising the steps of monitoring the extension of the piezo element () along a first direction (R) along which the tip () is moved towards the sample (), and adjusting the level of the probe () along the first direction (R) by means of an additional actuator (), when the nanoscanner () exhibits an extension below or above a threshold value. The invention further relates to a device () for controlling a scanning probe microscope.