Universitat Basel

University of Basel

Pascal Alexander Oehler

Marko Loparic

Marija Plodinec

Roderick Lim

Leon Camenzind

The present invention relates to sample holders for holding a sample, particularly for an atomic force microscope. Such a sample holder comprising a sample dish () comprising a bottom (), and an opening () arranged in said bottom () for receiving and holding the sample (). Furthermore the present invention relates to a sample holder system and to a method for transferring an e.g. biological sample () from a biopsy tool () to a sample holder.

Sample holder for an atomic force microscope

The present invention relates to a method for controlling a scanning probe microscope having a probe () with a tip () for interacting with a sample (), and a nanoscanner () for retaining the sample () or the probe (), comprising the steps of monitoring the extension of the piezo element () along a first direction (R) along which the tip () is moved towards the sample (), and adjusting the level of the probe () along the first direction (R) by means of an additional actuator (), when the nanoscanner () exhibits an extension below or above a threshold value. The invention further relates to a device () for controlling a scanning probe microscope.

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Buchs, Switzerland

Pascal Alexander Oehler