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For the Inventor, By the Inventor

Budapest, Hungary

Pal Maak

This inventor holds 9 USPTO granted patents, plus 4 CIPO patents. Top assignee: Femtonics Kft.. Active years: 2013-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pal Maak. Retrieved from https://idiyas.com/inventor/pal-maak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 9

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.8

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:

goldMedal9 out of 15 
 
Femtonics Kft.
 patents

Years Active: 2013-2025

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9 patents (USPTO):Explore Patents
1. 12339431 - Method for correcting motion artifacts of in vivo fluorescence measurements (2025-06-24),
2. 11156819 - Method for scanning along a 3-dimensional line and method for scanning a region of interest by scanning a plurality of 3-dimensional lines (2021-10-26),
3. 10613414 - Acousto-optic deflector with layered structure and method for deflecting an optical beam with such deflector (2020-04-07),
4. 10168598 - Method for scanning along a continuous scanning trajectory with a scanner system (2019-01-01),
5. 10018889 - Acousto-optic deflector comprising multiple electro-acoustic transducers (2018-07-10),
6. 9964750 - Optical microscope system for simultaneous observation of spatially distinct regions of interest (2018-05-08),
7. 9874437 - Method for the 3-dimensional measurement of a sample with a measuring system comprising a laser scanning microscope and such measuring system (2018-01-23),
8. 9535309 - Compensator system and method for compensating angular dispersion (2017-01-03),
9. 8559085 - Focusing system comprising acousto-optic deflectors for focusing an electromagnetic beam (2013-10-15),

Title: Innovations of Pal Maak in Fluorescence Measurement Technologies

Introduction

Pal Maak is a prominent inventor based in Budapest, Hungary. He has made significant contributions to the field of fluorescence measurement technologies, holding a total of nine patents. His innovative methods have advanced the capabilities of in vivo fluorescence measurements, showcasing his expertise and dedication to scientific progress.

Latest Patents

Among his latest patents is a method for correcting motion artifacts of in vivo fluorescence measurements. This method utilizes a 3D laser scanning microscope equipped with two pairs of orthogonally arranged acousto-optic deflectors. The process involves selecting a region of interest and guiding points, extending these points to cover the area, and repeatedly scanning the objects to obtain a time series of frames. The data is then corrected for motion artifacts to enhance the accuracy of fluorescence measurements. Another notable patent involves scanning along a 3-dimensional line and scanning a region of interest using multiple 3D lines, further demonstrating his innovative approach to microscopy.

Career Highlights

Pal Maak is currently associated with Femtonics Kft., a company known for its cutting-edge technologies in the field of microscopy. His work has not only contributed to the company's reputation but has also positioned him as a leading figure in the scientific community. His patents reflect a deep understanding of the complexities involved in fluorescence measurements and the technological advancements required to overcome existing challenges.

Collaborations

Pal Maak has collaborated with notable colleagues such as Gergely Katona and Balazs Rozsa. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas, further enhancing the impact of their work in the field.

Conclusion

Pal Maak's contributions to fluorescence measurement technologies through his innovative patents and collaborations highlight his role as a key inventor in this domain. His work continues to influence advancements in scientific research and technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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