The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Nov. 28, 2013
Femtonics Kft., Budapest, HU;
Femtonics Kft., Budapest, HU;
Abstract
The invention relates to an optical microscope system () for the simultaneous measurement of at least two spatially distinct regions of interest, characterized by comprising at least two distinct optical measuring heads () that can be simultaneously focused on spatially distinct arbitrary regions of interest, each optical measuring head is optically connectable with at least one scan head (), the optical microscope system further comprising a control system () connected to the at least one scan head and the optical measuring head, the control system being configured to provide for synchronized control of the operation of the at least one scan head and the at least two optical measuring head.
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