The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Mar. 01, 2019
Femtonics Kft., Budapest, HU;
Balazs Rozsa, Budapest, HU;
Gergely Katona, Budapest, HU;
Pal Maak, Budapest, HU;
Mate Veress, Budapest, HU;
Andras Feher, Szekszard, HU;
Gergely Szalay, Budapest, HU;
Peter Matyas, Budapest, HU;
Abstract
A method for scanning along a substantially straight line (3D line) lying at an arbitrary direction in a 3D space with a given speed uses a 3D laser scanning microscope having a first pair of acousto-optic deflectors deflecting a laser beam in the x-z plane (x axis deflectors) and a second pair of acousto-optic deflectors deflecting the laser beam in the y-z plane (y axis deflectors) for focusing the laser beam in 3D. Further, a method for scanning a region of interest uses a 3D laser scanning microscope having acousto-optic deflectors for focusing a laser beam within a 3D space defined by an optical axis (Z) of the microscope and X, Y axes that are perpendicular to the optical axis and to each other.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile