Paiboon Tangyunyong

Title: Paiboon Tangyunyong: Innovator in Electronic Circuit Testing

Introduction

Paiboon Tangyunyong is a notable inventor based in Albuquerque, NM (US). He has made significant contributions to the field of electronic circuit testing, holding a total of 7 patents. His innovative methods focus on enhancing the reliability and efficiency of electronic devices.

Latest Patents

One of his latest patents is a defect screening method for electronic circuits and circuit components using power spectrum analysis. This method involves non-destructive testing of electrical or electronic devices by measuring their power spectrum and performing Principal Component Analysis. By selecting a subset of principal components and comparing it to stored reference data, the sample device can be classified relative to reference populations.

Another significant patent is a scanning method for screening electronic devices. This visualization method applies a probe to a grid of multiple points on a circuit, monitoring the output produced in response to a stimulus waveform. A power spectrum analysis generates pixel values for each grid point, allowing for an image to be displayed that represents the multiple grid points with their respective pixel values.

Career Highlights

Throughout his career, Paiboon has worked with prominent organizations such as Sandia Corporation and National Technology & Engineering Solutions of Sandia, LLC. His work has significantly impacted the field of electronic testing and quality assurance.

Collaborations

Paiboon has collaborated with esteemed colleagues, including Edward I. Cole and Charles F. Hawkins. Their combined expertise has contributed to the advancement of innovative testing methods in electronics.

Conclusion

Paiboon Tangyunyong's contributions to electronic circuit testing through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence the development of reliable electronic devices.