The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Dec. 01, 2011
Applicants:
Paiboon Tangyunyong, Albuquerque, NM (US);
Edward I. Cole, Jr., Albuquerque, NM (US);
David J. Stein, Seattle, WA (US);
Inventors:
Paiboon Tangyunyong, Albuquerque, NM (US);
Edward I. Cole, Jr., Albuquerque, NM (US);
David J. Stein, Seattle, WA (US);
Assignee:
Sandia Corporation, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/26 (2013.01); G01R 27/28 (2013.01);
Abstract
A device sample is screened for defects using its power spectrum in response to a dynamic stimulus. The device sample receives a time-varying electrical signal. The power spectrum of the device sample is measured at one of the pins of the device sample. A defect in the device sample can be identified based on results of comparing the power spectrum with one or more power spectra of the device that have a known defect status.