The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Jul. 13, 2016
Applicant:

Sandia Corporation, Albuquerque, NM (US);

Inventors:

Paiboon Tangyunyong, Albuquerque, NM (US);

Edward I. Cole, Jr., Albuquerque, NM (US);

Guillermo M. Loubriel, Albuquerque, NM (US);

Joshua Beutler, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/307 (2006.01); G01R 27/28 (2006.01); G01R 31/303 (2006.01); G01R 31/311 (2006.01);
U.S. Cl.
CPC ...
G01R 31/307 (2013.01); G01R 27/28 (2013.01); G01R 31/303 (2013.01); G01R 31/311 (2013.01);
Abstract

A visualization method for screening electronic devices is provided. In accordance with the disclosed method, a probe is applied to a grid of multiple points on the circuit, and an output produced by the circuit in response to the stimulus waveform is monitored for each of multiple grid points where the probe is applied. A power spectrum analysis (PSA) produces a power spectrum amplitude, in each of one or more frequency bins, on the monitored output for each of the multiple grid points. The PSA provides a respective pixel value for each of the multiple grid points. An image is displayed, in which image portions representing the multiple grid points are displayed with the respective pixel values.


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