Oug-Ki Lee

Title: Oug-Ki Lee: A Trailblazer in Probe Technologies

Introduction

Oug-Ki Lee, an innovative inventor based in Seoul, South Korea, has made significant contributions to the field of probe technologies. With an impressive portfolio of 10 patents, his work primarily focuses on the design and manufacturing methods of advanced probes essential for electronic testing.

Latest Patents

Among his latest patents is a groundbreaking invention titled "Probe and method of making same." This technology reveals a probe structure with a minute pitch that corresponds precisely to various pad arrangements on a wafer. The probe features a uniquely bent body part that can be elastically tensioned or compressed, enhancing its functionality and adaptability. Additionally, he has developed a "Method of fabricating a probe card," which streamlines the creation of probe cards through a systematic approach involving soldering bumpers and conductive patterns, driven by a photolithography process.

Career Highlights

Oug-Ki Lee's professional journey includes integral roles at Phicom Corporation, where he fostered advancements in probe technology through research and development. His dedication to innovation in this field has established him as a key player among inventors in Korea.

Collaborations

Throughout his career, Oug-Ki has collaborated with esteemed colleagues, including Jung-Hoon Lee and Joo-Bae Kim. Their joint efforts have contributed to the successful development and commercialization of various probing technologies, further enhancing the capabilities of electronic testing.

Conclusion

Oug-Ki Lee continues to be a significant influence in the world of probe technologies. His innovative patents and collaborations mark him as a respected inventor dedicated to pushing the boundaries of what's possible in electronic testing methods. With each advancement, he reaffirms his commitment to innovation and excellence in the industry.