The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Feb. 13, 2006
Applicants:

Oug-ki Lee, Seoul, KR;

Jung Hoon Lee, Kyeonggi-do, KR;

Seong Hoon Jeong, Seoul, KR;

Inventors:

Oug-Ki Lee, Seoul, KR;

Jung Hoon Lee, Kyeonggi-do, KR;

Seong Hoon Jeong, Seoul, KR;

Assignee:

PHICOM Corporation, Gasan-dong, Kumcheon-ku, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In representative embodiments, a part of the beam portion is bent, e.g., such that the beam portion is zigzagged one or more times. A projection may be formed around a proximal end of the tip portion.


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