Osamu Ohguchi

Title: Osamu Ohguchi: Innovator in Semiconductor Testing Technology

Introduction

Osamu Ohguchi is a notable inventor based in Sayama, Japan, recognized for his contributions to semiconductor testing technology. With a total of two patents to his name, Ohguchi has made significant advancements in the field, particularly in the development of address pattern generators and test pattern generating apparatuses.

Latest Patents

Ohguchi's latest patents include an "Address Pattern Generator for Testing a Memory" and a "Test Pattern Generating Apparatus." The address pattern generator is designed for use in a test pattern generator, which generates various patterns for testing semiconductor memories. This invention features multiple fixed registers that store an initial value, a boundary value, and an operand indicating the amount of change of an address. The address operating circuits can utilize the content of these fixed registers, and the results are supplied as addresses to the memory under test. The test pattern generating apparatus interprets a microprogram to generate address and data patterns through arithmetic operations, producing a memory control signal that is applied to the memory under test.

Career Highlights

Throughout his career, Osamu Ohguchi has worked with prominent organizations, including Nippon Telegraph and Telephone Public Corporation and Takeda Riken Kogyo Kabushiki Kaisha. His work has significantly impacted the efficiency and effectiveness of semiconductor testing processes.

Collaborations

Ohguchi has collaborated with notable colleagues such as Masao Shimizu and Takashi Tokuno, contributing to the advancement of technology in their respective fields.

Conclusion

Osamu Ohguchi's innovative work in semiconductor testing technology has established him as a key figure in the industry. His patents reflect a deep understanding of the complexities involved in memory testing, showcasing his commitment to advancing technology.