The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 1981
Filed:
Oct. 10, 1979
Hiromi Maruyama, Gyoda, JP;
Takashi Tokuno, Gyoda, JP;
Masao Shimizu, Gyoda, JP;
Kohji Ishikawa, Funabashi, JP;
Naoaki Narumi, Tokyo, JP;
Osamu Ohguchi, Sayama, JP;
Nippon Telegraph and Telephone Public Corporation, Tokyo, JP;
Takeca Riken Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
An address pattern generator for use in a test pattern generator for generating various patterns for testing semiconductor memories. A plurality of fixed registers for storing an initial value at the start of a test, a boundary value and an operand indicating the amount of change of an address are provided in common to at least two address operating circuits. The address operating circuits are each capable of taking therein the content of a desired one of the fixed registers. At least two output registers are provided, which are each capable of taking therein the operation result of a desired one of the address operating circuit. The contents of these output registers are supplied as addresses to a memory under test.