The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1981
Filed:
Apr. 02, 1979
Masao Shimizu, Gyoda, JP;
Takashi Tokuno, Gyoda, JP;
Kohji Ishikawa, Funabashi, JP;
Naoaki Narumi, Tokyo, JP;
Osamu Ohguchi, Sayama, JP;
Nippon Telegraph and Telephone Public Corporation, Tokyo, JP;
Takeda Riken Kogyo Kabushikikaisha, Tokyo, JP;
Abstract
A test pattern generating apparatus in which a microprogram describing a test pattern to be generated is read for interpretation and execution, address and data patterns are generated by arithmetic operations and a memory control signal is produced, the address and data patterns and the memory control signal being applied to a memory under test. The address pattern is provided to an area inversion control signal generation section to produce an inversion control signal corresponding to the address pattern, by which the data pattern may be inverted and then outputted.