Tel Aviv, Israel

Orly Zvitia


Average Co-Inventor Count = 4.3

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2017-2022

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3 patents (USPTO):Explore Patents

Title: Orly Zvitia: Innovator in Defect Classification Technology

Introduction

Orly Zvitia is a prominent inventor based in Tel Aviv, Israel. She has made significant contributions to the field of defect classification, holding three patents that showcase her innovative approach to identifying and classifying defects in various specimens. Her work is instrumental in enhancing the accuracy and efficiency of defect detection processes.

Latest Patents

One of Orly Zvitia's latest patents is a method of defect classification and system thereof. This invention provides a comprehensive system and method for classifying defects in a specimen. The method involves obtaining one or more defect clusters detected on a defect map of the specimen. Each cluster is characterized by a set of attributes, including spatial density, which indicates the density of defects in specific regions. The process includes identifying defects of interest (DOI) in each cluster through respective defect filtrations.

Another notable patent by Zvitia is similar in nature, focusing on the classification of defects using a cluster classifier. This classifier is trained with cluster training data to associate each cluster with predefined labels. The method enhances the identification of defects by applying filtering parameters based on the cluster's label.

Career Highlights

Orly Zvitia is currently employed at Applied Materials Israel Limited, where she continues to develop innovative solutions in defect classification. Her expertise in this area has positioned her as a key player in her field, contributing to advancements that benefit various industries.

Collaborations

Orly has collaborated with notable colleagues, including Idan Kaizerman and Assaf Asbag. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Orly Zvitia's contributions to defect classification technology exemplify her commitment to innovation and excellence. Her patents reflect a deep understanding of the complexities involved in defect detection, making her a valuable asset in her field.

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