This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2016.
Company Filing History:
Years Active: 2016
Title: Ophir Gazinski: Innovator in Noise Measurement Technology
Introduction
Ophir Gazinski is a notable inventor based in Ramat Yishai, Israel. He has made significant contributions to the field of noise measurement and error ratio estimation. His innovative work has led to the development of a patented technology that enhances the accuracy of device performance assessments.
Latest Patents
Ophir Gazinski holds a patent for a "Method, apparatus, and system for measurement of noise statistics and bit error ratio estimation." This invention involves receiving a sample voltage from a device at two slicer elements. The decisions made by these slicer elements are compared to determine the soft error ratio for the device. This technology is crucial for improving the reliability of electronic devices.
Career Highlights
Ophir Gazinski is currently employed at Intel Corporation, where he continues to innovate and contribute to advancements in technology. His work at Intel has positioned him as a key player in the development of noise measurement systems.
Collaborations
Ophir has collaborated with notable colleagues, including Stephen J Peters and Adee Ofir Ran. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Ophir Gazinski's contributions to noise measurement technology exemplify the impact of innovative thinking in the field of electronics. His patented methods and systems are paving the way for more reliable devices in the future.