The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Mar. 15, 2013
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Adee O. Ran, Maayan Baruch, IL;

Amir Mezer, Haifa, IL;

Ophir Gazinski, Ramat Yishai, IL;

Sanjay R. Ravi, Hillsboro, OR (US);

David G. Ellis, Tualatin, OR (US);

Stephen J. Peters, Aloha, OR (US);

Jeffrey M. Shuey, Irmo, SC (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01R 19/00 (2006.01); H04L 1/00 (2006.01); H04L 1/20 (2006.01);
U.S. Cl.
CPC ...
H04L 1/203 (2013.01);
Abstract

A sample voltage is received from a device at a first slicer element and a second slicer element. A decision by the first slicer element based on the sample voltage is identified and compared with a decision of the second slicer element based on the sample voltage. The decision of the second slicer element is to be generated from a comparison of the sample voltage with a reference voltage for the second slicer element. Comparing the decisions can be the basis of a soft error ratio determined for a device.


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