Ondrej Ludmil Shanel

Title: Innovations of Ondrej Ludmil Shanel

Introduction

Ondrej Ludmil Shanel is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of imaging technology, holding a total of 4 patents. His work focuses on enhancing imaging techniques through innovative designs and methodologies.

Latest Patents

One of his latest patents is titled "Illumination apertures for extended sample lifetimes in helical tomography." This invention involves apertures with reference edges that define a sample irradiation zone and a shielded zone. The design allows for reduced irradiation exposure of the sample, which improves imaging quality. Another significant patent is the "Multi modal cryo compatible GUID grid." This invention features cryo-compatible sample grids with multi-modal cryo-EM compatible GUIDs. The grid includes an outer support structure for holding samples and inner support structures with apertures for sample placement. The identifiers on the grid are designed for readability by both optical and electron detectors, enhancing the functionality of the sample grids.

Career Highlights

Ondrej Shanel is currently employed at FEI Company, where he continues to develop innovative solutions in imaging technology. His work has been instrumental in advancing the capabilities of cryo-electron microscopy and related fields.

Collaborations

He collaborates with talented individuals such as Maarten Kuijper and Mathijs Petrus Van Den Boogaard, contributing to a dynamic research environment that fosters innovation.

Conclusion

Ondrej Ludmil Shanel's contributions to imaging technology through his patents and collaborations highlight his role as a leading inventor in his field. His innovative approaches continue to push the boundaries of what is possible in imaging techniques.