San Francisco, CA, United States of America

Oksen Toros Baris

USPTO Granted Patents = 3 

Average Co-Inventor Count = 3.7

ph-index = 2

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2016-2020

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3 patents (USPTO):Explore Patents

Title: Oksen Toros Baris: Innovator in Wafer Inspection Technologies

Introduction

Oksen Toros Baris is an accomplished inventor based in San Francisco, CA. With a total of three patents to his name, Baris has made significant contributions to the field of wafer inspection technologies. His innovations focus on enhancing defect detection and classification processes, which are pivotal in the semiconductor industry.

Latest Patents

Baris's most recent patents highlight his expertise in inspection methodologies. One noteworthy invention is the "Inspection for Multiple Process Steps in a Single Inspection Process." This patent outlines a method for detecting defects on a wafer by analyzing output generated during an inspection process conducted after the completion of multiple process steps. It allows for the determination of defect positions relative to different design portions on the wafer, facilitating improved quality control.

Another significant patent, titled "Method and System for Iterative Defect Classification," presents a systematic approach for classifying defects. This innovation encompasses acquiring images of specimens, grouping defects by their types, and iteratively refining the classification process based on user manual inputs. The procedure continues until no new defect types are identified, ultimately enhancing the accuracy of defect classification.

Career Highlights

Oksen Toros Baris is currently employed at KLA Corporation, a global leader in process control and yield management solutions for the semiconductor industry. His inventive work has positioned him as a key player in the realm of wafer inspection, contributing to advancements that improve manufacturing efficiency and product quality.

Collaborations

Throughout his career, Baris has collaborated with notable professionals in the industry, including colleagues Hong Chen and Kenong Wu. Together, they push the boundaries of innovation within their respective fields, combining their unique skills to tackle complex challenges in semiconductor technology.

Conclusion

Oksen Toros Baris exemplifies the role of an innovative inventor in the semiconductor industry. His patents and collaborative efforts have paved the way for enhanced defect detection and classification technologies. As the semiconductor landscape continues to evolve, Baris’s contributions will undoubtedly play a crucial role in shaping its future.

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