Jerusalem, Israel

Ofer Kadar

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ofer Kadar. Retrieved from https://idiyas.com/inventor/ofer-kadar-ulezeuyw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:

goldMedal1 out of 834,570 
Other
 patents

Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Unveiling the Innovations of Ofer Kadar

Introduction:

Ofer Kadar, a talented inventor based in Jerusalem, IL, is making waves in the technology world with his groundbreaking innovations. With a focus on advancing inspection systems, Kadar has already secured a notable patent in the field.

Latest Patents:

Ofer Kadar's most recent patent is the Dark Field Inspection System. This apparatus revolutionizes the inspection of samples through its unique design, utilizing a radiation source and multiple image sensors to detect defects on a surface with precision and efficiency.

Career Highlights:

Kadar's journey as an inventor showcases his dedication to pushing the boundaries of technology. With a keen eye for detail and a strong understanding of optics, he has successfully brought his ideas to life in the form of tangible inventions.

Collaborations:

In his pursuit of innovation, Ofer Kadar has had the opportunity to collaborate with skilled professionals in the industry. Some of his notable coworkers include Doron Korngut and Erez Admoni, who have contributed their expertise to the development of Kadar's inventions.

Conclusion:

Ofer Kadar's impressive work in the field of inspection systems stands as a testament to his ingenuity and passion for innovation. With a patent already under his belt and a promising career ahead, Kadar is undoubtedly a name to watch in the world of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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