This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1998.
Company Filing History:
Years Active: 1998
Title: Norio Kanno: Innovator in Fault Detection Systems
Introduction
Norio Kanno is a distinguished inventor based in Tokyo, Japan. He is known for his innovative contributions to fault detection systems, which play a crucial role in various technological applications. His work has significantly advanced the reliability and efficiency of these systems.
Latest Patents
Kanno holds a patent for a "System for testing a fault detecting means." This invention provides a test system for a fault detecting mechanism. During normal operation, a fault forcibly generating circuit allows a transmission path signal to pass through while generating a test signal identical to the transmission path signal. During testing, the circuit outputs a 'Low' level test signal to the fault detecting circuit based on a control signal. The fault detecting circuit generates a step-out alarm, which is monitored by the control portion. This system enables the control portion to determine the operational status based on the presence or absence of the step-out alarm.
Career Highlights
Norio Kanno is associated with Mitsubishi Electric Corporation, where he has made significant contributions to the field of fault detection. His innovative approach has led to advancements in the reliability of electronic systems.
Collaborations
Kanno has collaborated with notable colleagues, including Kazuo Kenmoku and Shigeo Tominaga. Their combined expertise has fostered a productive environment for innovation and development.
Conclusion
Norio Kanno's work in fault detection systems exemplifies the importance of innovation in technology. His contributions continue to influence the field, ensuring greater reliability in electronic systems.