Mitsubishi Denki Kabushiki Kaisha

Norio Kanno

Yukio Hirano

Shigeo Tominaga

Kazuo Kenmoku

The invention provides a test system of a fault detecting means, in which, during a normal operation, a fault forcibly generating circuit lets a transmission path signal inputted from the outside pass through as it is, generates a test signal which is the same as that of the transmission path signal, and outputs it to a fault detecting circuit. During a time of testing, the fault forcibly generating circuit outputs 'Low' level of the test signal forcibly to the fault detecting circuit, according to a test control signal outputted from a control portion. When the fault detecting circuit detects this test signal, an step-out alarm is generated and transmitted to the control portion. The control portion monitors the step-out alarm from the fault detecting circuit. The control portion judges the operation to be normal if the step-out alarm is outputted, and to be abnormal if the step-out alarm is not outputted under the condition that the step-out alarm is not outputted at the time of non-testing.

Growing community of inventors

Tokyo, Japan

Norio Kanno