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For the Inventor, By the Inventor

Utsunomiya, Japan

Nobuaki Ogushi

This inventor holds 16 USPTO granted patents and 1 EPO patent. Top assignee: Canon Kabushiki Kaisha. Active years: 1997-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobuaki Ogushi. Retrieved from https://idiyas.com/inventor/nobuaki-ogushi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 16

% Patents Active = 56.3


Average Co-Inventor Count = 2.4

ph-index = 8

Forward Citations = 215(Granted Patents)


Location History:

  • Yokohama, JP (1997)
  • Tochigi, JP (2004 - 2007)
  • Utsunomiya, JP (1998 - 2010)

Company Filing History:

goldMedal16 out of 92,994 
 
Canon Kabushiki Kaisha
 patents

Years Active: 1997-2010

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16 patents (USPTO):Explore Patents
1. 7805279 - Remote maintenance system (2010-09-28),
2. 7225041 - Information providing method and system (2007-05-29),
3. 7062343 - Remote maintenance system (2006-06-13),
4. 6980872 - Information providing method and system (2005-12-27),
5. 6963786 - Remote maintenance system (2005-11-08),
6. 6957112 - Industrial machine management system and method (2005-10-18),
7. 6897456 - Differential pumping system and exposure apparatus (2005-05-24),
8. 6892109 - Remote maintenance system (2005-05-10),
9. 6867843 - Debris removing system for use in X-ray light source (2005-03-15),
10. 6795161 - Exposure apparatus, method of manufacturing semiconductor devices and plant therefor (2004-09-21),
11. 6665371 - Synchrotron radiation measurement apparatus, X-ray exposure apparatus, and device manufacturing method (2003-12-16),
12. 6385497 - Remote maintenance system (2002-05-07),
13. 6160865 - X-ray exposure apparatus with synchrotron radiation intensity measurement (2000-12-12),
14. 6009144 - X-ray system and X-ray exposure apparatus (1999-12-28),
15. 5760878 - Exposure apparatus and alignment discrimination method (1998-06-02),

Title: Nobuaki Ogushi: Innovator in Remote Maintenance Systems

Introduction

Nobuaki Ogushi is a prominent inventor based in Utsunomiya, Japan. He has made significant contributions to the field of industrial equipment monitoring and maintenance. With a total of 16 patents to his name, Ogushi continues to push the boundaries of innovation in his industry.

Latest Patents

One of his latest inventions is a remote maintenance system designed for factories. This system utilizes host computers to monitor industrial equipment. Each host computer is connected to a management host computer on the vendor side through the internet. The factory-side host computer detects any issues with the industrial equipment and notifies the vendor side with status information representing the trouble state. In response, the vendor-side host computer provides the factory with countermeasure information to address the trouble state. Another notable patent is an information providing method and system. This system includes a reception unit that receives first information concerning a process from a customer via a network. A processing unit simulates the process based on this information and prepares second information based on the simulation results. Finally, a transmission unit sends the second information back to the customer through the network.

Career Highlights

Nobuaki Ogushi is currently employed at Canon Kabushiki Kaisha, a leading company in imaging and printing technologies. His work at Canon has allowed him to develop innovative solutions that enhance operational efficiency and reliability in industrial settings.

Collaborations

Ogushi has collaborated with notable colleagues, including Masaya Ogura and Hirohisa Ohta. Their combined expertise has contributed to the successful development of various technologies and patents.

Conclusion

Nobuaki Ogushi is a key figure in the realm of industrial innovation, particularly in remote maintenance systems. His contributions continue to shape the future of industrial equipment monitoring and maintenance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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