Hod Hasharon, Israel

Nir Ben-David Dodzin


Average Co-Inventor Count = 2.7

ph-index = 3

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 2012-2020

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13 patents (USPTO):Explore Patents

Title: Innovator Nir Ben-David Dodzin: Pioneering Advances in Inspection Technology

Introduction

Nir Ben-David Dodzin is a notable inventor based in Hod Hasharon, Israel. He has made significant contributions to the field of inspection technology, holding a total of 13 patents. His work focuses on developing advanced systems and methods for size estimation and defect detection in various articles.

Latest Patents

Among his latest patents is a system, method, and computer program product for size estimation. This computerized method estimates the size of a nanometric part of an inspected article by acquiring inspection results from an inspection image. The method involves fitting an approximation function to the inspection results and determining the estimated size based on parameters of the approximation function. Another significant patent is a system, method, and computer program product for fitting-based defect detection. This system is designed to detect defects in inspection images by acquiring a distribution of comparison values and fitting an approximation function to this distribution. It includes a defect detection module that sets criteria for identifying defects based on the fitting results.

Career Highlights

Nir Ben-David Dodzin is currently employed at Applied Materials Israel Limited, where he continues to innovate in the field of inspection technology. His expertise and inventions have contributed to advancements in the industry, enhancing the capabilities of inspection systems.

Collaborations

Nir has collaborated with notable colleagues, including Moshe Amzaleg and Zvi Goren. Their combined efforts have fostered a collaborative environment that promotes innovation and the development of cutting-edge technologies.

Conclusion

Nir Ben-David Dodzin stands out as a prominent inventor in the realm of inspection technology. His patents and contributions reflect a commitment to advancing the field and improving the accuracy of inspection systems. His work continues to influence the industry and pave the way for future innovations.

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