Ning Tan

Title: Innovations by Inventor Ning Tan

Introduction

Ning Tan is a notable inventor based in Allen, TX (US), recognized for his contributions to the field of integrated circuits. He holds a total of 5 patents, showcasing his innovative approach to technology and engineering.

Latest Patents

Ning Tan's latest patents include a "Low cost apparatus for insitu testing of packaged integrated circuits during stressing." This apparatus features a burn-in board that contains a microcontroller unit and a heater socket, allowing for insitu testing of packaged integrated circuits while under stress. Additionally, he has developed a method for insitu testing of a packaged integrated circuit while under stress, as well as a method for insitu testing of multiple packaged integrated circuits under similar conditions. Another significant patent is the "Low cost flash memory fabrication flow based on metal gate process." This integrated circuit includes a flash cell where the top gate of the sense transistor is a metal sense gate over the floating gate, with specific dimensions and configurations that enhance its functionality.

Career Highlights

Throughout his career, Ning Tan has worked with prominent companies such as Texas Instruments Corporation and Freescale Semiconductor, Inc. His experience in these organizations has contributed to his expertise in the field of integrated circuits and semiconductor technology.

Collaborations

Ning Tan has collaborated with various professionals in his field, including Weidong Tian and Jose A Rodriguez-Latorre. These collaborations have likely enriched his work and led to further advancements in his projects.

Conclusion

Ning Tan's innovative patents and career achievements highlight his significant contributions to the field of integrated circuits. His work continues to influence technology and engineering practices today.