Epe, Netherlands

Niels Tielenburg



Average Co-Inventor Count = 5.9

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020-2024

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2 patents (USPTO):Explore Patents

Title: Niels Tielenburg: Innovator in Calibration and Validation Tools

Introduction

Niels Tielenburg is a notable inventor based in Epe, Netherlands. He has made significant contributions to the field of optical measurement and calibration, holding a total of 2 patents. His work focuses on developing tools and methods that enhance the accuracy and efficiency of measuring systems.

Latest Patents

Tielenburg's latest patents include a calibration tool and method designed for laser-triangulation measuring systems. This innovative calibration tool features a tool body that defines a reference plane and is rotatable around a rotation axis. The tool body is equipped with multiple calibration surfaces that create a pattern of calibration positions, allowing for precise adjustments in height relative to the reference plane.

Another significant patent is a validation tool and method for validating optical equipment used in measuring various characteristics of tyre components. This tool includes reference elements that represent different characteristics, ensuring accurate measurements during the winding application of tyre components around a tyre building drum.

Career Highlights

Niels Tielenburg is associated with VMI Holland B.V., a company known for its advanced technology in the tyre manufacturing industry. His work at VMI has allowed him to develop innovative solutions that address complex measurement challenges in the field.

Collaborations

Throughout his career, Tielenburg has collaborated with talented professionals such as John Van De Vrugt and Mattheus Jacobus Kaagman. These collaborations have contributed to the development of cutting-edge technologies in optical measurement.

Conclusion

Niels Tielenburg's contributions to calibration and validation tools have significantly impacted the optical measurement industry. His innovative patents reflect his commitment to enhancing measurement accuracy and efficiency.

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