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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10792877 B1

PDFFull Text
Date of Patent:
Oct. 06, 2020

Filed:

Jan. 15, 2016

Validation tool and method for validating optical equipment

Applicant:

Vmi Holland B.v., Epe, NL;

Inventors:

Mattheus Jacobus Kaagman, Epe, NL;

Jeroen Smeenk, Epe, NL;

Niels Tielenburg, Epe, NL;

John Van De Vrugt, Epe, NL;

Assignee:

VMI HOLLAND B.V., , NL;

Attorney:

Hayes Soloway P.C.

Primary Examiner:

Hoa Q Pham

Int. Cl.
CPC ...
B29D 30/26 (2006.01); B29D 30/30 (2006.01); B29D 30/00 (2006.01); B29D 30/24 (2006.01);
U.S. Cl.
CPC ...
B29D 30/26 (2013.01); B29D 30/0061 (2013.01); B29D 30/244 (2013.01); B29D 30/3007 (2013.01); B29D 30/3057 (2013.01); B29D 2030/0066 (2013.01);
Abstract

Provided is a validation tool and a method for validating optical equipment that is used for measuring a plurality of characteristics of one or more tyre components during winding application of said tyre components around a tyre building drum, wherein a first tyre component of the one or more tyre components includes a first characteristic of the plurality of characteristics which, after measuring, is overlapped by the same or another tyre component of the one or more tyre components including a second characteristic of the plurality of characteristics, wherein the validation tool is provided with a first reference element that is arranged to represent the first characteristic and a second reference element that is arranged to represent the second characteristic, wherein the second reference element is offset with respect to the first reference element to at least partially expose the first reference element.

Find Patent Forward Citations

Kaagman, Mattheus. (2020). Validation tool and method for validating optical equipment (U.S. Patent No. 10792877). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10792877

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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