The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Mar. 13, 2020
Vmi Holland B.v., Epe, NL;
Egbert Grietinus Kellij, Epe, NL;
John Van De Vrugt, Epe, NL;
Niels Tielenburg, Epe, NL;
Teunis Johannes Verbruggen, Epe, NL;
Peter Beekman, Epe, NL;
Cees Johan Van Voskuilen, Epe, NL;
Robin Nusselder, Epe, NL;
Gerjan Asuerus Berghorst, Epe, NL;
Titus Ruben Verlaan, Epe, NL;
Bart Kofoed, Epe, NL;
Quinten Matthijs Bergmans, Epe, NL;
VMI HOLLAND B.V., Epe, NL;
Abstract
The invention relates to a calibration tool and a method for calibrating a laser-triangulation measuring system, wherein the calibration tool comprises a tool body that defines a reference plane and that is rotatable relative to the measuring system about a rotation axis perpendicular to said reference plane, wherein the tool body is provided with one or more calibration surfaces that define a pattern of calibration positions, wherein the pattern comprises at least three columns extending in a radial direction away from the rotation axis and at least three rows extending in a circumferential direction about the rotation axis, wherein for each column the calibration positions within said respective column vary in height relative to the reference plane in a height direction perpendicular to said reference plane and wherein for each row the calibration positions within the respective row vary in height in the height direction relative to the reference plane.