Vmi Holland B.v.

Niels Tielenburg

John Van De Vrugt

Mattheus Jacobus Kaagman

Teunis Johannes Verbruggen

Robin Nusselder

Quinten Matthijs Bergmans

Egbert Grietinus Kellij

Peter Beekman

Cees Johan Van Voskuilen

Jeroen Smeenk

Gerjan Asuerus Berghorst

Titus Ruben Verlaan

Bart Kofoed

The invention relates to a calibration tool and a method for calibrating a laser-triangulation measuring system, wherein the calibration tool comprises a tool body that defines a reference plane and that is rotatable relative to the measuring system about a rotation axis perpendicular to said reference plane, wherein the tool body is provided with one or more calibration surfaces that define a pattern of calibration positions, wherein the pattern comprises at least three columns extending in a radial direction away from the rotation axis and at least three rows extending in a circumferential direction about the rotation axis, wherein for each column the calibration positions within said respective column vary in height relative to the reference plane in a height direction perpendicular to said reference plane and wherein for each row the calibration positions within the respective row vary in height in the height direction relative to the reference plane.

Calibration tool and method

Provided is a validation tool and a method for validating optical equipment that is used for measuring a plurality of characteristics of one or more tyre components during winding application of said tyre components around a tyre building drum, wherein a first tyre component of the one or more tyre components includes a first characteristic of the plurality of characteristics which, after measuring, is overlapped by the same or another tyre component of the one or more tyre components including a second characteristic of the plurality of characteristics, wherein the validation tool is provided with a first reference element that is arranged to represent the first characteristic and a second reference element that is arranged to represent the second characteristic, wherein the second reference element is offset with respect to the first reference element to at least partially expose the first reference element.

Validation tool and method for validating optical equipment

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Epe, Netherlands

Niels Tielenburg