Milpitas, CA, United States of America

Nick Petrone


Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovations of Nick Petrone

Introduction

Nick Petrone is an accomplished inventor based in Milpitas, CA (US). He has made significant contributions to the field of charged particle beam systems, particularly in defect inspection and review technologies. His innovative work has led to the development of a unique patent that enhances the capabilities of scanning electron microscopy.

Latest Patents

Nick Petrone holds a patent for a system titled "Defect inspection and review using transmissive current image of charged particle beam system." This system includes a scanning electron microscopy sub-system with an electron source that generates an electron beam. The electron-optical assembly directs the electron beam to the specimen, allowing for detailed analysis. The system also features grounding paths that generate transmission signals based on electron beam-induced transmission currents. A controller is included to manage the scanning process and generate transmission current images from the received signals. This innovative approach significantly improves defect detection in various materials.

Career Highlights

Nick Petrone is currently employed at Kla Corporation, where he applies his expertise in electron microscopy and charged particle beam systems. His work at Kla Corporation has positioned him as a key player in advancing technologies that are critical for semiconductor manufacturing and materials analysis.

Collaborations

Nick has collaborated with notable colleagues, including Hong Xiao and Lawrence Muray. Their combined efforts contribute to the ongoing development of innovative solutions in the field of microscopy and materials inspection.

Conclusion

Nick Petrone's contributions to the field of charged particle beam systems exemplify the spirit of innovation. His patent and work at Kla Corporation highlight the importance of advanced technologies in defect inspection and materials analysis. His achievements continue to influence the industry and pave the way for future advancements.

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