Hsinchu, Taiwan

Ni-Chung Chen

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2003.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Innovations by Ni-Chung Chen in Wafer Processing Technology

Introduction

Ni-Chung Chen is an accomplished inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor manufacturing, particularly in optimizing wafer processing techniques. His innovative approach aims to enhance the efficiency and output of wafer production.

Latest Patents

Ni-Chung Chen holds a patent for a method and computer program designed to utilize tool performance data for the dynamic dispatch of wafer processing. This invention focuses on maximizing the quantity of output by dynamically matching wafer lots waiting for processing with available tools. The method prioritizes wafer lots and processes them first, ensuring that the longest process time for each permutation is calculated. The invention ultimately selects the optimal permutation for processing based on the highest wafers per hour (PWPH) and total wafers per hour (TWPH).

Career Highlights

Ni-Chung Chen is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work has been pivotal in advancing the methodologies used in wafer processing, contributing to the company's reputation for innovation and excellence.

Collaborations

Ni-Chung Chen collaborates with talented colleagues, including Chien-Yu Lin and Li-Wen Liu, who contribute to the development and implementation of innovative solutions in the semiconductor field.

Conclusion

Ni-Chung Chen's contributions to wafer processing technology exemplify the impact of innovative thinking in the semiconductor industry. His patent reflects a commitment to enhancing production efficiency and output quality.

Profile summary based on public USPTO records.
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