Santa Clara, CA, United States of America

Neeraj Khanna

This inventor holds 2 USPTO granted patents. Top assignee: Kla Tencor Corporation. Active years: 2013-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Neeraj Khanna. Retrieved from https://idiyas.com/inventor/neeraj-khanna-e9pxdvca

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2013-2017

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Innovator Neeraj Khanna – Contributions to Semiconductor and Solar Technology

Introduction

Neeraj Khanna is an accomplished inventor based in Santa Clara, California, who has made significant strides in the field of semiconductor and solar technology. With a total of two patents to his name, Khanna has demonstrated a commitment to advancing these critical areas of research and development.

Latest Patents

Khanna's most recent patents showcase his innovative thinking and technical expertise. The first, titled "Combined Semiconductor Metrology System," details a semiconductor wafer inspection system that includes a camera and multiple illuminators. This system illuminates lines of the wafer sequentially, allowing the camera to capture interleaved images that can be separated into individual frames for analysis. The conveyor system facilitates the movement of the wafer, enabling adjacent lines to be illuminated successively, further enhancing the efficiency of inspections.

His second patent, "Solar Metrology Methods and Apparatus," introduces methods for measuring the photoluminescence of incoming silicon wafers. This innovative approach extracts critical parameters such as minority carrier lifetime, diffusion length, and defect density, which are essential for predicting the efficiency of final solar cells. The patent outlines techniques for illuminating the wafer, measuring luminescent response from various angles, and utilizing multiple wavelengths of light to assess the minority carrier lifetime. This innovative work lays the groundwork for improved solar cell performance.

Career Highlights

Neeraj Khanna currently works at KLA-Tencor Corporation, a leader in advanced semiconductor process control and yield management systems. His experience at KLA-Tencor allows him to apply his knowledge in semiconductor technology to develop cutting-edge metrology solutions that benefit the industry.

Collaborations

Throughout his career, Khanna has collaborated with other talented professionals, including Scott Allen Young and Guoheng Zhao. These partnerships foster an environment of innovation and collective problem-solving, driving forward the advancements in semiconductor and solar technologies.

Conclusion

With a wealth of knowledge and a passion for innovation, Neeraj Khanna continues to make significant contributions to semiconductor and solar technology. His patents not only reflect his ingenuity but also pave the way for future advancements in these vital industries. As technology continues to evolve, Khanna's work will undoubtedly play an essential role in shaping the future of metrology in semiconductor and solar applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…