Company Filing History:
Years Active: 2009-2021
Title: Naoki Sagisaka: Innovator in Optical Measurement Technology
Introduction
Naoki Sagisaka is a prominent inventor based in Tondabayashi, Japan. He has made significant contributions to the field of optical measurement technology, holding 2 patents that showcase his innovative approach to solving complex problems in this domain.
Latest Patents
Sgisaka's latest patents include an optical measuring device and a malfunction determination system. The optical measuring device features a light measurement unit and an acceleration sensor that detects the device's acceleration. It stores reference data obtained from measuring light from a reference object and includes a determination unit that assesses whether the measurement data satisfies specific malfunction conditions. The malfunction determination system is designed to ensure the reliability of optical measurements by identifying potential malfunctions.
Another notable patent is the optical measurement system, which manages the optical properties of samples within a predetermined range. This system includes a measuring device for assessing the optical property value of samples and a reader for identifying samples through attached tags. The controller compares the optical property values with management information to determine if they fall within acceptable limits.
Career Highlights
Naoki Sagisaka has worked with notable companies such as Konica Minolta, Inc. and Konica Minolta Sensing, Inc. His experience in these organizations has allowed him to develop and refine his expertise in optical measurement technologies.
Collaborations
Throughout his career, Sagisaka has collaborated with talented individuals, including Koji Yamamoto and Masahiko Sakimoto. These partnerships have contributed to the advancement of his innovative projects and patents.
Conclusion
Naoki Sagisaka's work in optical measurement technology exemplifies his commitment to innovation and problem-solving. His patents reflect a deep understanding of the complexities involved in optical measurements and the importance of reliability in this field.