The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Jun. 24, 2005
Koji Watanabe, Edogawa-ku, JP;
Toru Kobayashi, Ibaraki, JP;
Masao Nakamuro, Takarazuka, JP;
Naoki Sagisaka, Tondabayashi, JP;
Koji Watanabe, Edogawa-ku, JP;
Toru Kobayashi, Ibaraki, JP;
Masao Nakamuro, Takarazuka, JP;
Naoki Sagisaka, Tondabayashi, JP;
Konica Minolta Sensing, Inc., Sakai-Shi, JP;
Abstract
An optical measurement system which manages whether an optical property of a sample falls within a predetermined management range. The optical measurement system has a measuring device for measuring the optical property value of the inspected sample, a reader for reading an attribute identification information of an identification tag attached to the sample, and a storage section for storing optical property management information concerning a plurality of kinds of samples each in a manner corresponding to attribute identification information of each sample. A controller in the optical measurement system reads out from the storage section the optical property management information corresponding to the attribute identification information of the sample read by said reader, and compares the optical property management information with the optical property value of the sample, and then determines whether the optical property value falls within an allowable range in the optical property management information.