Company Filing History:
Years Active: 2008-2009
Title: Koji Watanabe: Innovator in Optical Measurement Systems
Introduction
Koji Watanabe is a prominent inventor based in Edogawa-ku, Japan. He has made significant contributions to the field of optical measurement systems, holding a total of 2 patents. His work focuses on enhancing the accuracy and efficiency of optical property management.
Latest Patents
Watanabe's latest patents include an "Optical Measurement System and Sample Optical Property Management Method." This innovative system manages whether the optical property of a sample falls within a predetermined management range. It features a measuring device that assesses the optical property value of the inspected sample, a reader for identifying the sample's attribute information, and a storage section for managing optical property data across various samples. The system's controller compares the measured optical property value with the stored management information to determine compliance with allowable ranges.
Another notable patent is the "Standard Plane Sample and Optical Characteristic Measurement System." This invention provides a standard plane sample that supplies reference data to an optical characteristic measuring device. It includes a sample portion for measurement and a recording medium that stores identification and reference data related to the optical characteristics of the sample.
Career Highlights
Koji Watanabe is currently employed at Konica Minolta Sensing, Inc., where he continues to develop innovative optical measurement technologies. His work has significantly impacted the industry, leading to advancements in measurement accuracy and data management.
Collaborations
Watanabe collaborates with esteemed colleagues such as Masao Nakamuro and Norio Ishikawa. Their combined expertise fosters a creative environment that drives innovation in optical measurement systems.
Conclusion
Koji Watanabe's contributions to optical measurement technology exemplify his dedication to innovation. His patents reflect a commitment to improving measurement systems, which can have far-reaching implications in various fields.