The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Nov. 23, 2005
Applicants:
Koji Watanabe, Edogawa-ku, JP;
Norio Ishikawa, Osaka, JP;
Masao Nakamuro, Takarazuka, JP;
Inventors:
Assignee:
Konica Minolta Sensing, Inc., Sakai-Shi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract
A standard plane sample which supplies an optical characteristic measuring device with reference data. The standard plane sample including a sample portion that is measured by the optical characteristic measuring device to supply measurement data, and a recording medium that stores identification data for identifying a kind of the sample portion as well as reference data corresponding to the optical characteristic of the sample portion.