Company Filing History:

8 out of 3,715

Lsi Logic Corporation

patents

Years Active: 2002-2011

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12 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7913125 - BISR mode to test the redundant elements and regular functional memory to avoid test escapes (2011-03-22),

2. 7536611 - Hard BISR scheme allowing field repair and usage of reliability controller (2009-05-19),

3. 7493541 - Method and system for performing built-in-self-test routines using an accumulator to store fault information (2009-02-17),

4. 7260758 - Method and system for performing built-in self-test routines using an accumulator to store fault information (2007-08-21),

5. 7185243 - Testing implementation suitable for built-in self-repair (BISR) memories (2007-02-27),

6. 7076699 - Method for testing semiconductor devices having built-in self repair (BISR) memory (2006-07-11),

7. 6928598 - Scan method for built-in-self-repair (BISR) (2005-08-09),

8. 6898143 - Sharing fuse blocks between memories in hard-BISR (2005-05-24),

9. 6871297 - Power-on state machine implementation with a counter to control the scan for products with hard-BISR memories (2005-03-22),

10. 6757854 - Detecting faults in dual port FIFO memories (2004-06-29),

11. 6550032 - Detecting interport faults in multiport static memories (2003-04-15),

12. 6496950 - Testing content addressable static memories (2002-12-17),

Title: Innovations by Mukesh K Puri

Introduction

Mukesh K Puri is a notable inventor based in Fremont, CA, with a significant contribution to the field of memory testing and repair technologies. He holds a total of 12 patents, showcasing his expertise and innovative spirit in the industry.

Latest Patents

Among his latest patents is a BISR mode designed to test redundant elements and regular functional memory to avoid test escapes. This innovative method ensures that all redundant elements of the memory, including those not in use, are thoroughly tested. It also checks the interaction between redundant elements and adjacent functional memory. The repair information generated is utilized to repair the memory effectively. Additionally, he has developed a hard BISR scheme that allows for field repair and the usage of a reliability controller. This scheme provides on-chip assessment of the repair amount on a given memory and flags any device as a fail when it exceeds a predetermined limit.

Career Highlights

Mukesh has worked with prominent companies such as LSI Logic Corporation and LSI Corporation, where he has honed his skills and contributed to various innovative projects. His work has significantly impacted the field of memory technology.

Collaborations

Throughout his career, Mukesh has collaborated with notable professionals, including Ghasi R Agrawal and William D Schwarz, enhancing the quality and scope of his inventions.

Conclusion

Mukesh K Puri's contributions to memory testing and repair technologies reflect his innovative mindset and dedication to advancing the field. His patents and collaborations highlight his significant role in shaping modern memory solutions.

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