Cairo, Egypt

Muhammad Nagi

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Si-Ware Systems. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Muhammad Nagi. Retrieved from https://idiyas.com/inventor/muhammad-nagi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Muhammad Nagi: Innovator in Optical MEMS Technology

Introduction

Muhammad Nagi is a notable inventor based in Cairo, Egypt. He has made significant contributions to the field of optical micro-electro-mechanical systems (MEMS). His innovative work focuses on enhancing the testing processes for these advanced technologies.

Latest Patents

Nagi holds a patent for an "Integrated optical probe card and system for batch testing of optical MEMS structures with in-plane optical axis using micro-optical bench components." This invention relates to a system designed for wafer testing of optical MEMS structures. It utilizes micro-optical bench components to redirect light, enabling effective testing of optical MEMS structures with vertical light injection.

Career Highlights

Muhammad Nagi is associated with Si-Ware Systems, a company that specializes in advanced semiconductor technologies. His role at the company has allowed him to apply his expertise in optical MEMS, contributing to the development of innovative solutions in the industry.

Collaborations

Nagi has worked alongside talented colleagues such as Bassam Amanallah Saadany and Mostafa Medhat. Their collaborative efforts have further advanced the research and development of optical MEMS technologies.

Conclusion

Muhammad Nagi's contributions to the field of optical MEMS through his patent and work at Si-Ware Systems highlight his role as an influential inventor. His innovative approaches continue to shape the future of optical testing technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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