Moritz Stoerring

Title: Moritz Stoerring: Innovator in Wafer Metrology

Introduction

Moritz Stoerring is a notable inventor based in Brussels, Belgium. He has made significant contributions to the field of wafer metrology, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of wafer edge profile analysis.

Latest Patents

Moritz Stoerring holds a patent for a method titled "Bonded Wafer Metrology." This invention involves analyzing wafer edge profile images at various locations around a bonded wafer, which consists of a top wafer and a carrier wafer. An offset curve is generated based on these images, allowing for the determination of the displacement of the top wafer relative to the carrier wafer. The images may be generated at multiple locations and can include shadowgram images. The system designed for this purpose includes an imaging system connected to a controller. He has 1 patent to his name.

Career Highlights

Moritz Stoerring is associated with Kla Tencor Corporation, a company known for its advanced semiconductor manufacturing equipment. His role at the company has allowed him to work on cutting-edge technologies that are crucial for the semiconductor industry.

Collaborations

Some of his notable coworkers include Kaushik Sah and Thomas Krah. Their collaboration has likely contributed to the innovative environment at Kla Tencor Corporation.

Conclusion

Moritz Stoerring's contributions to wafer metrology exemplify the importance of innovation in the semiconductor industry. His patent reflects a commitment to advancing technology and improving manufacturing processes.