Tkuma, Israel

Mordehay Amirim

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Orbotech Limited. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mordehay Amirim. Retrieved from https://idiyas.com/inventor/mordehay-amirim-e6k4icr0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Mordehay Amirim

Introduction

Mordehay Amirim is a notable inventor based in Tkuma, Israel. He has made significant contributions to the field of electrical circuits through his innovative patent. His work focuses on enhancing the manufacturing processes of patterned objects, which are crucial in the production of electrical circuits.

Latest Patents

Mordehay Amirim holds a patent for a "System and method for inspection of multiple features of patterned objects in the manufacture of electrical circuits." This method involves performing defect detection on patterned objects using an optical defect detection machine (ODDM). The ODDM is employed to measure spatial coordinates and physical attributes of various features, ensuring high-quality manufacturing standards.

Career Highlights

Amirim is associated with Orbotech Limited, a company known for its advanced technology in the electronics manufacturing sector. His role at Orbotech has allowed him to apply his innovative ideas and contribute to the development of cutting-edge inspection systems.

Collaborations

Some of his notable coworkers include Vered Gatt and Itzhak Saki Hakim. Their collaboration has likely fostered an environment of innovation and creativity within the company.

Conclusion

Mordehay Amirim's contributions to the field of electrical circuits through his patent demonstrate his commitment to innovation and quality in manufacturing processes. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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