This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Kla Corporation. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Innovations by Inventor Mordechy Kot
Introduction
Mordechy Kot is a notable inventor based in Migdal Haemek, Israel. He has made significant contributions to the field of metrology, particularly in overlay measurement systems. With a total of 2 patents to his name, his work has advanced the precision and accuracy of measurement techniques in various applications.
Latest Patents
Mordechy Kot's latest patents include innovative technologies that enhance metrology systems. One of his patents is titled "Single-cell scatterometry overlay with sensitivity calibration." This metrology system processes data from overlay targets with varying offsets to generate sensitivity metrics and overlay measurements. Another significant patent is the "Parallax method for a single-cell diffraction based measurement of misregistration." This system utilizes dipole illumination beams to gather metrology data and determine effective stack heights, improving the accuracy of overlay measurements.
Career Highlights
Mordechy Kot is currently employed at Kla Corporation, a leading company in the field of metrology and semiconductor manufacturing. His work at Kla Corporation has positioned him as a key player in developing advanced measurement technologies. His expertise in overlay metrology has contributed to the company's reputation for innovation and excellence.
Collaborations
Mordechy Kot collaborates with Yuval Lamhot, a fellow professional in the field. Their partnership has fostered the development of cutting-edge technologies that push the boundaries of metrology.
Conclusion
Mordechy Kot's contributions to metrology through his patents and work at Kla Corporation highlight his role as an influential inventor. His innovative approaches to overlay measurement systems continue to impact the industry positively.