This inventor holds 1 USPTO granted patent. Top assignee: Fuji Electric., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Mitsuru Yoshida - Innovator in Semiconductor Testing Technology
Introduction
Mitsuru Yoshida is an inventor based in Shiojiri-city, Japan. He has made significant contributions to the field of semiconductor device testing. His innovative approach focuses on improving the efficiency and effectiveness of testing methods for semiconductor devices.
Latest Patent Applications
Mitsuru Yoshida has filed a patent application for a "TEST JIG, TESTING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE." This application describes a test jig designed for testing multiple semiconductor devices formed on a wafer. The test jig includes a substrate with an opening that allows air to be injected during testing. A chamber surrounds the opening and is positioned lower than the substrate. The first probe measures each semiconductor device and is connected to the substrate. The chamber features a surrounding member that floats upward in response to air injection, a support part to hold the surrounding member before it floats, and a restraining member to prevent the surrounding member from contacting the wafer after air injection stops.
Conclusion
Mitsuru Yoshida's work in semiconductor testing technology showcases his innovative spirit and dedication to advancing the field. His patent application reflects a thoughtful approach to improving testing methods for semiconductor devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile