Tokyo, Japan

Mitsuo Hori



Average Co-Inventor Count = 3.6

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2007-2009

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4 patents (USPTO):Explore Patents

Title: Innovations of Mitsuo Hori in Electronic Device Testing

Introduction

Mitsuo Hori is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of electronic device testing, holding a total of 4 patents. His work focuses on improving the reliability and efficiency of testing methods for electronic devices and semiconductor manufacturing.

Latest Patents

Mitsuo Hori's latest patents include a variety of innovative technologies. One of his patents is a test apparatus designed for testing electronic devices by providing test signals and comparing output signals with anticipated values. This apparatus features a reference timing detecting unit, a setting unit for minimum time settings, an acquisition unit for signal value acquisition, and a determination unit for identifying defective devices. Another patent involves a test emulator for semiconductor devices, which includes a test pattern providing means, expected value storage means, margin determination means, and a notification system to alert users about small margins at comparison timings.

Career Highlights

Mitsuo Hori is currently associated with Adv Antest Corporation, where he continues to innovate in the field of electronic testing. His work has been instrumental in enhancing the accuracy and efficiency of testing processes, which are crucial for the development of reliable electronic devices.

Collaborations

Mitsuo has collaborated with notable colleagues such as Hideki Tada and Takahiro Kataoka. Their combined expertise has contributed to the advancement of testing technologies in the semiconductor industry.

Conclusion

Mitsuo Hori's contributions to electronic device testing and semiconductor manufacturing are significant. His innovative patents reflect his commitment to improving testing methodologies, ensuring the reliability of electronic devices in the market.

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