Aomori, Japan

Minoru Sato

This inventor holds 6 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Kabushiki Kaisha Nihon Micronics. Active years: 2006-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Minoru Sato. Retrieved from https://idiyas.com/inventor/minoru-sato-2lvt4vxa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6 

% Patents Active = 100.0


Average Co-Inventor Count = 1.2

ph-index = 1

Forward Citations = 5(Granted Patents)


Location History:

  • Hiraka-machi, JP (2006)
  • Musashino, JP (2015)
  • Aomori, JP (2023 - 2024)

Company Filing History:


Years Active: 2006-2024

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6 patents (USPTO):Explore Patents

Title: Minoru Sato - Innovator in Inspection Technology

Introduction

Minoru Sato, a prominent inventor based in Aomori, Japan, has made significant contributions to the field of inspection technology. With a total of six patents to his name, Sato has focused on developing advanced devices that enhance the inspection processes in semiconductor manufacturing.

Latest Patents

Sato's latest innovations include a sophisticated connecting device for inspection. This device consists of a probe head designed to accommodate both electric and optical contacts, ensuring precise alignment for effective inspections. The probe head maintains the tip ends of these contacts exposed on its lower surface, while the proximal ends are accessible from the upper surface. A transformer integrates connecting wires and optical wires, facilitating seamless electrical and optical connections. The ingenious design allows the optical contacts to continuously penetrate through both the probe head and the transformer, maintaining an exact positional relationship with the terminals of semiconductor devices. This innovation exemplifies Sato’s commitment to improving inspection accuracy and efficiency.

Career Highlights

Minoru Sato works at Kabushiki Kaisha Nihon Micronics, a company renowned for its innovation in electronic and semiconductor technologies. His work is characterized by a dedication to developing cutting-edge inspection equipment that addresses the evolving needs of the semiconductor industry.

Collaborations

Throughout his career, Sato has collaborated with notable colleagues, including Michitaka Okuta and Yuki Saito. Their combined expertise has fostered an innovative environment that has contributed to the success of their projects and advancements in inspection technology.

Conclusion

Minoru Sato’s catalog of patents underscores his role as a key figure in the development of inspection devices, particularly in the semiconductor sector. His innovative solutions and collaborations with industry peers continue to push the boundaries of technology, making him an influential inventor in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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