The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2023
Filed:
Sep. 30, 2020
Applicant:
Kabushiki Kaisha Nihon Micronics, Tokyo, JP;
Inventors:
Michitaka Okuta, Tokyo, JP;
Yuki Saito, Tokyo, JP;
Toshinaga Takeya, Aomori, JP;
Shou Harako, Aomori, JP;
Jukiya Fukushi, Aomori, JP;
Minoru Sato, Aomori, JP;
Hisao Narita, Aomori, JP;
Assignee:
Kabushiki Kaisha Nihon Micronics, Musashino, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01); G01R 1/073 (2006.01); G01R 31/26 (2020.01); H01S 5/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0207 (2013.01); G01R 1/073 (2013.01); G01R 31/2607 (2013.01); H01S 5/0014 (2013.01);
Abstract
An optical probe receives an optical signal output from a test subject. The optical probe includes an optical waveguide composed of a core portion and a cladding portion disposed on an outer periphery of the core portion, wherein an incident surface of the optical waveguide, which receives the optical signal, is a convex spherical surface with a constant curvature radius.