Company Filing History:
Years Active: 2019-2021
Title: Innovations of Mingfeng Lu in Physical Parameter Estimation
Introduction
Mingfeng Lu is a prominent inventor based in Beijing, China. He has made significant contributions to the field of physical parameter estimation through his innovative methods and devices. With a total of 3 patents, his work focuses on enhancing the accuracy and stability of interferometric measurements.
Latest Patents
Mingfeng Lu's latest patents include a method, device, and electronic apparatus for estimating physical parameters using discrete chirp Fourier transform. This invention involves reading a Newton's rings fringe pattern obtained from interferometric measurements. The process includes obtaining the number and length of first-direction signals, performing a discrete chirp Fourier transform on these signals, and estimating physical parameters based on the resulting magnitude spectrum. This method allows for high accuracy in estimating physical parameters involved in interferometric measurements.
Another notable patent by Lu is a physical parameter estimating method, device, and electronic apparatus that utilizes sampling theorem in the fractional Fourier transform domain. This invention also begins with reading a Newton's rings fringe pattern and involves downsampling the pattern to calculate a magnitude spectrum. The method determines a matched order of the intensity distribution signal, enabling accurate estimation of physical parameters even in the presence of noise and obstacles.
Career Highlights
Mingfeng Lu is affiliated with the Beijing Institute of Technology, where he continues to advance research in his field. His innovative approaches have garnered attention and recognition within the scientific community.
Collaborations
Mingfeng Lu has collaborated with notable colleagues such as Jinmin Wu and Feng Zhang. Their combined expertise contributes to the development of cutting-edge technologies in physical parameter estimation.
Conclusion
Mingfeng Lu's contributions to the field of physical parameter estimation through his innovative patents demonstrate his commitment to advancing technology. His work not only enhances measurement accuracy but also addresses challenges posed by noise and obstacles in interferometric measurements.
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